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SRPS EN IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Dec 29, 2023

General information

60.60     Dec 29, 2023

ISS

N022

European Norm

31.080.01  

English  

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Scope

This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

Life cycle

NOW

PUBLISHED
SRPS EN IEC 63287-2:2023
60.60 Standard published
Dec 29, 2023

Related project

Adopted from EN IEC 63287-2:2023

Adopted from IEC 63287-2:2023 ED1 IDENTICAL