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IEC 63287-2:2023 ED1

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Mar 29, 2023

General information

60.60     Mar 29, 2023

IEC

TC 47

International Standard

31.080.01  

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Scope

IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

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PUBLISHED
IEC 63287-2:2023 ED1
60.60 Standard published
Mar 29, 2023

National adoptions

SRPS EN IEC 63287-2:2023  
ISS

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

60.60   Standard published

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