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SRPS EN IEC 63616:2026

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

Apr 30, 2026

General information

60.60     Apr 30, 2026

ISS

N086

European Norm

17.220.20     29.050  

English  

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Scope

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

Life cycle

NOW

PUBLISHED
SRPS EN IEC 63616:2026
60.60 Standard published
Apr 30, 2026

Related project

Adopted from EN IEC 63616:2026

Adopted from IEC 63616:2025 ED1