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dnaSRPS EN IEC 61169-73:2023

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

General information

50.60     Oct 3, 2025

ISS

N086

European Norm

17.220.20     29.050  

English  

Scope

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

Life cycle

NOW

PROJECT
dnaSRPS EN IEC 61169-73:2023
50.60 Close of voting. Proof returned by secretariat
Oct 3, 2025

Related project

Adopted from EN IEC 63616:2026 IDENTICAL

Adopted from IEC 63616:2025 ED1 IDENTICAL