dnaSRPS EN IEC 61169-73:2023

Merenje provodljivosti za tanke metalne filmove na frekvencijama mikro i milimetarskih talasnih dužina metodom balansiranog tipa cirkularnog disk rezonatora

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

Apstrakt

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.