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delSRPS EN IEC 62047-55:2024

Semiconductor devices - Micro-electromechanical devices - Part 55: Silicon based MEMS fabrication technology - Test method of microstructure pendulum impact

General information

30.98     Feb 17, 2025

30.99    Jul 22, 2025

ISS

N022

European Norm

31.080.99  

English  

Life cycle

NOW

ABANDON
delSRPS EN IEC 62047-55:2024
30.98 Project deleted
Feb 17, 2025

Related project

Adopted from prEN IEC 62047-55 IDENTICAL

Adopted from IEC 62047-55 ED1 IDENTICAL