Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

IEC 62047-55 ED1

Semiconductor devices - Micro-electromechanical devices - Part 55: Silicon based MEMS fabrication technology - Test method of microstructure pendulum impact

General information

30.20     Dec 5, 2025

PCC    Jan 30, 2026

IEC

TC 47/SC 47F

International Standard

31.080.99  

Life cycle

NOW

PROJECT
IEC 62047-55 ED1
30.20 CD study/ballot initiated
Dec 5, 2025

National adoptions

Semiconductor devices - Micro-electromechanical devices - Part 55: Silicon based MEMS fabrication technology - Test method of microstructure pendulum impact

30.98   Project deleted

N022 more

Preview

To view the full content, you need to register or to log in to your account by clicking on the "Log in" button

Login