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prSRPS IEC TS 63202-2:2021 ED1:2026

Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells

General information

10.99    

ISS

N082

Technical Specification

27.160  

English  

Scope

IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.

Life cycle

NOW

PROJECT
prSRPS IEC TS 63202-2:2021 ED1:2026
10.99 New project approved

Related project

Adopted from IEC TS 63202-2:2021 ED1 IDENTICAL