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prSRPS IEC TS 63202-2:2021 ED1:2026

Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells

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10.99    

ISS

N082

Tehnička specifikacija

27.160  

engleski  

Apstrakt

IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.

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prSRPS IEC TS 63202-2:2021 ED1:2026
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Identičan sa IEC TS 63202-2:2021 ED1 IDENTICAL