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SRPS EN 60749-35:2008

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

Jun 19, 2008

General information

60.60     Jun 19, 2008

ISS

N022

European Norm

31.080.01  

English  

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Scope

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

Life cycle

NOW

PUBLISHED
SRPS EN 60749-35:2008
60.60 Standard published
Jun 19, 2008

Related project

Adopted from EN 60749-35:2006