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SRPS EN 62373:2008

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Jun 19, 2008

General information

60.60     Jun 19, 2008

ISS

N022

European Norm

31.080  

English  

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Scope

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

Life cycle

NOW

PUBLISHED
SRPS EN 62373:2008
60.60 Standard published
Jun 19, 2008

Related project

Adopted from EN 62373:2006