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SRPS EN 60749-17:2008

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Oct 9, 2008
95.99   Withdrawal of Standard   Nov 30, 2022

General information

95.99     Nov 30, 2022

ISS

N022

European Norm

31.080.01  

English  

повучен на седници 2022-10-06

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Scope

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-17:2008
95.99 Withdrawal of Standard
Nov 30, 2022

REVISED BY

PUBLISHED
SRPS EN IEC 60749-17:2020

Related project

Adopted from EN 60749-17:2003