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SRPS EN 60749-18:2008

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Oct 9, 2008
95.99   Withdrawal of Standard   Nov 30, 2022

General information

95.99     Nov 30, 2022

ISS

N022

European Norm

31.080.01  

English  

повучен на седници 2022-10-06

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Scope

Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-18:2008
95.99 Withdrawal of Standard
Nov 30, 2022

REVISED BY

PUBLISHED
SRPS EN IEC 60749-18:2020

Related project

Adopted from EN 60749-18:2003