SRPS EN IEC 60749-18:2020

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Scope

<!-- NEW! -->IEC 60749-18:2019 is available as <a href="https://webstore.iec.ch/publication/64958">IEC 60749-18:2019 RLV</a> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.</br></br>IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:

- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;

- addition of a Bibliography, which includes ASTM standards relevant to this test method.