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SRPS EN 60749-6:2008

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Dec 29, 2008
95.99   Withdrawal of Standard   Nov 30, 2020

General information

95.99     Nov 30, 2020

ISS

N022

European Norm

31.080.01  

English  

повучен – седница 2020-11-09

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Scope

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-6:2008
95.99 Withdrawal of Standard
Nov 30, 2020

REVISED BY

PUBLISHED
SRPS EN 60749-6:2017

Related project

Adopted from EN 60749-6:2002