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SRPS EN 60749-13:2009

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

May 20, 2009
95.99   Withdrawal of Standard   Nov 30, 2022

General information

95.99     Nov 30, 2022

ISS

N022

European Norm

31.080.01  

English  

повучен на седници 2022-10-06

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Scope

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

Life cycle

NOW

WITHDRAWN
SRPS EN 60749-13:2009
95.99 Withdrawal of Standard
Nov 30, 2022

REVISED BY

PUBLISHED
SRPS EN IEC 60749-13:2018

Related project

Adopted from EN 60749-13:2002