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SRPS EN IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Oct 31, 2018

General information

60.60     Oct 31, 2018

ISS

N022

European Norm

31.080.01  

English  

sedica 2018-09-25

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Scope

<span lang="EN-US">IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. </span>The salt atmosphere test is considered destructive.

This edition includes the following significant technical changes with respect to the previous edition:

a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Life cycle

PREVIOUSLY

WITHDRAWN
SRPS EN 60749-13:2009

NOW

PUBLISHED
SRPS EN IEC 60749-13:2018
60.60 Standard published
Oct 31, 2018

Related project

Adopted from EN IEC 60749-13:2018

Adopted from IEC 60749-13:2018 ED2 IDENTICAL