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SRPS EN 62276:2012

Single crystal wafers for surface acoustic wave (SAW) device appplications - Specifications and measuring methods

Aug 27, 2012
95.99   Withdrawal of Standard   Jan 29, 2016

General information

95.99     Jan 29, 2016

ISS

N040

European Norm

31.140  

English  

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Scope

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

Life cycle

NOW

WITHDRAWN
SRPS EN 62276:2012
95.99 Withdrawal of Standard
Jan 29, 2016

REVISED BY

WITHDRAWN
SRPS EN 62276:2015

Related project

Adopted from EN 62276:2005