Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

SRPS EN ISO 18452:2016

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)

Oct 31, 2016

General information

60.60     Oct 31, 2016

ISS

B184

European Norm

81.060.30  

English  

plan 2016

Buying

Published

Language in which you want to receive the document.

Scope

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

Life cycle

PREVIOUSLY

WITHDRAWN
SRPS EN 1071-1:2010

NOW

PUBLISHED
SRPS EN ISO 18452:2016
60.60 Standard published
Oct 31, 2016

Related project

Adopted from EN ISO 18452:2016

Adopted from ISO 18452:2005