Published
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
WITHDRAWN
SRPS EN 1071-1:2010
PUBLISHED
SRPS EN ISO 18452:2016
60.60
Standard published
Oct 31, 2016