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ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer

Nov 16, 2005

General information

90.93     Mar 13, 2025

ISO

ISO/TC 206

International Standard

81.060.30  

English   French  

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Published

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Scope

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

Life cycle

NOW

PUBLISHED
ISO 18452:2005
90.93 Standard confirmed
Mar 13, 2025

National adoptions

SRPS EN ISO 18452:2016  
ISS

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)

60.60   Standard published

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