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SRPS EN EN 62878-1-1:2016

Device embedded substrate - Part 1-1: Generic specification - Test methods

Mar 22, 2016

General information

60.60     Mar 22, 2016

ISS

N040

European Norm

31.180     31.190  

English  

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Scope

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

Life cycle

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PUBLISHED
SRPS EN EN 62878-1-1:2016
60.60 Standard published
Mar 22, 2016

Related project

Adopted from EN 62878-1-1:2015