mass specific surface area
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localization microscopy
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super-resolution microscopy
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SRPS CEN ISO/TS 80004-6:2017
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total internal reflection fluorescence microscopy; TIRF microscopy
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SRPS CEN ISO/TS 80004-6:2017
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fluorescence microscopy
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SRPS CEN ISO/TS 80004-6:2017
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fluorescence
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surface enhanced ellipsometric contrast microscopy; SEEC microscopy
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SRPS CEN ISO/TS 80004-6:2017
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confocal optical microscopy
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SRPS CEN ISO/TS 80004-6:2017
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scanning ion microscopy
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SRPS CEN ISO/TS 80004-6:2017
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low energy electron microscopy; LEEM
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SRPS CEN ISO/TS 80004-6:2017
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scaninng transmission electron microscopy; STEM
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SRPS CEN ISO/TS 80004-6:2017
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transmission electron microscopy; TEM
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SRPS CEN ISO/TS 80004-6:2017
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scanning electron microscopy; SEM
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near-field scanning optical spectroscopy, NSOM; scanning near-field optical microscopy, SNOM
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scanning tunneling microscopy; STM
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SRPS CEN ISO/TS 80004-6:2017
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atomic force microscopy, AFM; scanning force microscopy SFM
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scanning probe microscopy; SPM
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SRPS CEN ISO/TS 80004-6:2017
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electrical zone sensing; Coulter counter
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SRPS CEN ISO/TS 80004-6:2017
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size-exclusion chromatography; SEC
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SRPS CEN ISO/TS 80004-6:2017
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centrifugal liquid sedimentation, CLS; differential centrifugal sedimentation, DCS
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SRPS CEN ISO/TS 80004-6:2017
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