X-ray photoelectron spectroscopy; XPS
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SRPS CEN ISO/TS 80004-6:2017
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ultraviolet photoelectron spectroscopy; UPS
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SRPS CEN ISO/TS 80004-6:2017
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Auger electron spectroscopy; AES
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SRPS CEN ISO/TS 80004-6:2017
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Auger electron
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SRPS CEN ISO/TS 80004-6:2017
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electron energy loss spectroscopy; EELS
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SRPS CEN ISO/TS 80004-6:2017
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electron spectrometer
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SRPS CEN ISO/TS 80004-6:2017
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tip enhanced Raman spectroscopy; TERS
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SRPS CEN ISO/TS 80004-6:2017
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surface enhanced Raman spectroscopy; SERS
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SRPS CEN ISO/TS 80004-6:2017
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Raman spectroscopy
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SRPS CEN ISO/TS 80004-6:2017
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Raman effect
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SRPS CEN ISO/TS 80004-6:2017
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Furier transform spectroscopy; FTIR
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SRPS CEN ISO/TS 80004-6:2017
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fluorescence correlation spectroscopy; FCS
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SRPS CEN ISO/TS 80004-6:2017
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UV–Vis spectroscopy
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SRPS CEN ISO/TS 80004-6:2017
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fluorescence spectroscopy
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SRPS CEN ISO/TS 80004-6:2017
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photoluminescence spectroscopy; PL spectroscopy
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SRPS CEN ISO/TS 80004-6:2017
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photoluminescence
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SRPS CEN ISO/TS 80004-6:2017
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luminescence
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SRPS CEN ISO/TS 80004-6:2017
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optical spectroscopy
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SRPS CEN ISO/TS 80004-6:2017
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Brunauer-Emmett-Teller method; BET method
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SRPS CEN ISO/TS 80004-6:2017
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volume specific surface area
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SRPS CEN ISO/TS 80004-6:2017
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