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dual polarization interferometry; DPI
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SRPS CEN ISO/TS 80004-6:2017
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Mössbauer spectroscopy
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SRPS CEN ISO/TS 80004-6:2017
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electron paramagnetic resonance, EPR; electron spin resonance; ESR
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SRPS CEN ISO/TS 80004-6:2017
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nuclear magnetic resonance spectroscopy; NMR spectroscopy
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SRPS CEN ISO/TS 80004-6:2017
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evolved-gas analysis; EGA
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SRPS CEN ISO/TS 80004-6:2017
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atom-probe tomography
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SRPS CEN ISO/TS 80004-6:2017
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secondary-ion mass spectrometry; SIMS
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SRPS CEN ISO/TS 80004-6:2017
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inductively coupled plasma mass spectrometry; ICP-MS
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SRPS CEN ISO/TS 80004-6:2017
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energy-dispersive X-ray spectroscopy; EDS or EDX
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SRPS CEN ISO/TS 80004-6:2017
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X-ray fluorescence; XRF
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SRPS CEN ISO/TS 80004-6:2017
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X-ray absorption spectroscopy; XAS
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SRPS CEN ISO/TS 80004-6:2017
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X-ray photoelectron spectroscopy; XPS
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SRPS CEN ISO/TS 80004-6:2017
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ultraviolet photoelectron spectroscopy; UPS
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SRPS CEN ISO/TS 80004-6:2017
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Auger electron spectroscopy; AES
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SRPS CEN ISO/TS 80004-6:2017
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Auger electron
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SRPS CEN ISO/TS 80004-6:2017
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electron energy loss spectroscopy; EELS
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SRPS CEN ISO/TS 80004-6:2017
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electron spectrometer
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SRPS CEN ISO/TS 80004-6:2017
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tip enhanced Raman spectroscopy; TERS
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SRPS CEN ISO/TS 80004-6:2017
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surface enhanced Raman spectroscopy; SERS
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SRPS CEN ISO/TS 80004-6:2017
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Raman spectroscopy
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SRPS CEN ISO/TS 80004-6:2017
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