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low energy electron microscopy; LEEM
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scaninng transmission electron microscopy; STEM
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transmission electron microscopy; TEM
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scanning electron microscopy; SEM
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near-field scanning optical spectroscopy, NSOM; scanning near-field optical microscopy, SNOM
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scanning tunneling microscopy; STM
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atomic force microscopy, AFM; scanning force microscopy SFM
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scanning probe microscopy; SPM
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electrical zone sensing; Coulter counter
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size-exclusion chromatography; SEC
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centrifugal liquid sedimentation, CLS; differential centrifugal sedimentation, DCS
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field flow fractionation; FFF
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Faraday-cup aerosol electrometer; FCAE
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differential mobility analyzing system; DMAS
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SRPS CEN ISO/TS 80004-6:2017
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differential electrical mobility classifier; DEMC
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condensation particle counter; SRS
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nanoparticle tracking analysis, NTA; particle tracking analysis, PTA
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SRPS CEN ISO/TS 80004-6:2017
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dynamic light scattering, DLS; photon correlation spectroscopy, PCS; quasi-elastic light scattering, QELS
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SRPS CEN ISO/TS 80004-6:2017
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hydrodynamic diameter
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SRPS CEN ISO/TS 80004-6:2017
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light scattering
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SRPS CEN ISO/TS 80004-6:2017
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