Projects
Search Serbian, European and international standards. Identify the standard organization, select the standard number or keyword, and complete the search you want. You can also add a standard drafting stage or a committee / national committee that drafted the standard
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 6: Visual Imaging devices
30.99
CD approved for registration as DIS
Switching device for islanding (SDFI)
50.60
Close of voting. Proof returned by secretariat
Fully flexible organic light emitting diode (OLED) panels for general lighting - Performance requirements
40.99
Full report circulated: DIS approved for registration as FDIS
LED lamps – Safety requirements
40.99
Full report circulated: DIS approved for registration as FDIS
LED Light sources – Performance requirements
40.99
Full report circulated: DIS approved for registration as FDIS
Coupled-stress acceleration test sequence for photovoltaic modules and materials
50.00
Final text received or FDIS registered for formal approval
Concentric lay overhead electrical stranded conductors
30.20
CD study/ballot initiated
Excimer sources for germicidal purpose - Safety specifications
30.99
CD approved for registration as DIS
Measurement of ozone production from UV-C radiation sources and luminaires
20.99
WD approved for registration as CD
Germicidal equipment - Low-pressure mercury UV radiation sources for germicidal purpose - Safety specifications
30.60
Close of voting/ comment period
Electrical safety of Snow melting photovoltaic (Snow PV) module - Requirements for construction and testing
30.20
CD study/ballot initiated
Visual comfort of display terminals - Part 1: Introduction
40.99
Full report circulated: DIS approved for registration as FDIS
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle
40.60
Close of voting
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
30.99
CD approved for registration as DIS
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process
40.00
DIS registered
Quantum Interconnect – Part 1: Introduction and roadmap for standardization
50.00
Final text received or FDIS registered for formal approval
High-level test description table for development of production test programs
40.99
Full report circulated: DIS approved for registration as FDIS
Guideline of High-Level Test Description Table for Development of Production Test Programs
50.00
Final text received or FDIS registered for formal approval
