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Visual comfort of display terminals - Part 1: Introduction

40.99   Full report circulated: DIS approved for registration as FDIS

TC 100 more

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle

40.60   Close of voting

TC 47 more

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light

30.99   CD approved for registration as DIS

TC 47 more

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process

40.00   DIS registered

TC 47 more

Quantum Interconnect – Part 1: Introduction and roadmap for standardization

50.00   Final text received or FDIS registered for formal approval

TC 86 more

High-level test description table for development of production test programs

40.99   Full report circulated: DIS approved for registration as FDIS

TC 91 more

Guideline of High-Level Test Description Table for Development of Production Test Programs

50.00   Final text received or FDIS registered for formal approval

TC 91 more

Rotating electrical machines for the traction of road vehicles

30.20   CD study/ballot initiated

PC 131 more

Nuclear power plants - Instrumentation, control and electrical power systems - System software vulnerability and system software end-of-support management

50.00   Final text received or FDIS registered for formal approval

TC 45/SC 45A more

Design principles and validation methods for the maintenance of microbial control for non-disposable fluid paths of dialysis equipment

20.99   WD approved for registration as CD

TC 62/SC 62D more

Prosumer plugs and prosumer inlets for household and similar purposes - Part 2: Standard sheets and gauges

20.99   WD approved for registration as CD

TC 23/SC 23B more

Atmospheric and altitude correction

20.99   WD approved for registration as CD

TC 42 more

Measuring equipment for electrical and electromagnetic quantities - Environmental aspects

50.00   Final text received or FDIS registered for formal approval

TC 85 more

Semiconductor devices - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 1: Classification of defects

40.60   Close of voting

TC 47 more

LOW-VOLTAGE FUSES: Product data and properties for information exchange

20.99   WD approved for registration as CD

TC 32/SC 32B more

Open Charge Point Protocol 2.01 Ed4 (Fast track)

40.20   DIS ballot initiated: 12 weeks

TC 69 more

Open Charge Point Protocol 2.1 Ed2 (fast track)

40.20   DIS ballot initiated: 12 weeks

TC 69 more

Interpretation of Dissolved Gas Analysis (DGA) in natural and synthetic esters

50.00   Final text received or FDIS registered for formal approval

TC 10 more