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Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array

30.99   CD approved for registration as DIS

TC 47/SC 47E more

Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes

50.99   FDIS or proof approved for publication

TC 47/SC 47E more

Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

30.99   CD approved for registration as DIS

TC 47/SC 47E more

Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

30.20   CD study/ballot initiated

TC 47/SC 47E more

Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

30.20   CD study/ballot initiated

TC 47/SC 47E more

Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling

30.99   CD approved for registration as DIS

TC 47 more

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

40.60   Close of voting

TC 47 more

Standard test procedures for semiconductor X-ray energy spectrometers

20.99   WD approved for registration as CD

TC 45 more

Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements

40.60   Close of voting

TC 45/SC 45B more

Nuclear facilities - Electrical equipment important to safety - Qualification

40.60   Close of voting

TC 45/SC 45A more

Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry

30.20   CD study/ballot initiated

TC 86/SC 86A more

Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry

30.20   CD study/ballot initiated

TC 86/SC 86A more

Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss

40.60   Close of voting

TC 86/SC 86A more

Optical fibres - Part 1-49: Measurement methods and test procedures - Differential mode delay

20.99   WD approved for registration as CD

TC 86/SC 86A more

Optical fibres - Part 1-50: Measurement methods and test procedures - Damp heat (steady state) tests

40.60   Close of voting

TC 86/SC 86A more

Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests

40.60   Close of voting

TC 86/SC 86A more

Optical fibres - Part 1-52: Measurement methods and test procedures - Change of temperature tests

40.60   Close of voting

TC 86/SC 86A more

Optical fibres - Part 1-53: Measurement methods and test procedures - Water immersion tests

40.60   Close of voting

TC 86/SC 86A more