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IEC 63287-3 ED1

Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module

General information

60.00     Jul 17, 2026

PPUB    Aug 28, 2026

IEC

TC 47

International Standard

31.080.01  

Scope

IEC 63287-3:2026 specifies guidelines for a reliability qualification plan for power semiconductor modules to assure reliability targets over the entire product life.
Power semiconductor modules with incorporated control circuits are excluded. Clamped packages that need external pressure for being mounted in a system are excluded, e.g. disc-type pressure pack devices.
This document is not intended for medical, military, aeronautics and astronautics-related applications.
NOTE Throughout the document, the term power semiconductor module refers to multichip semiconductor power modules as defined in IEC 60191-4.

Life cycle

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PROJECT
IEC 63287-3 ED1
60.00 Standard under publication
Jul 17, 2026

National adoptions

Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module

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