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IEC 63287-3 ED1

Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module

General information

50.20     Apr 24, 2026

PRVD    Jun 5, 2026

IEC

TC 47

International Standard

31.080.01  

Scope

IEC 63287-3 ED1 specifies guidelines for a reliability qualification plan for power semiconductor modules to assure reliability targets over the entire product life.
Power semiconductor modules with incorporated control circuits are excluded. Clamped packages that need external pressure for being mounted in a system are excluded, e.g. disc-type pressure pack devices.
This document is not intended for medical, military, aeronautics and astronautics-related applications.
NOTE: Throughout the document, the term power semiconductor module refers to multichip semiconductor power modules defined as "isolated or non-isolated semiconductor module with two or more semiconductor chips, according to the package outline style code “MP” specified in IEC 60191‑4".

Life cycle

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PROJECT
IEC 63287-3 ED1
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Apr 24, 2026

National adoptions

Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module

50.20   Proof sent to secretariat or FDIS ballot initiated: 8 weeks

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