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dnaSRPS EN IEC 63287-3:2024

Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module

General information

50.20     Apr 24, 2026

50.60    Jun 5, 2026

ISS

N022

European Norm

31.080.01  

English  

Scope

IEC 63287-3 ED1 specifies guidelines for a reliability qualification plan for power semiconductor modules to assure reliability targets over the entire product life.
Power semiconductor modules with incorporated control circuits are excluded. Clamped packages that need external pressure for being mounted in a system are excluded, e.g. disc-type pressure pack devices.
This document is not intended for medical, military, aeronautics and astronautics-related applications.
NOTE: Throughout the document, the term power semiconductor module refers to multichip semiconductor power modules defined as "isolated or non-isolated semiconductor module with two or more semiconductor chips, according to the package outline style code “MP” specified in IEC 60191‑4".

Life cycle

NOW

PROJECT
dnaSRPS EN IEC 63287-3:2024
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Apr 24, 2026

Related project

Adopted from FprEN IEC 63287-3:2026 IDENTICAL

Adopted from IEC 63287-3 ED1 IDENTICAL

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