IEC 63581-1 ED1
Semiconductor devices - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 1: Classification of defects
General information
40.20
Nov 7, 2025
PRVC
Jan 30, 2026
IEC
TC 47
International Standard
31.080.99
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NOW
PROJECT
IEC 63581-1 ED1
40.20
DIS ballot initiated: 12 weeks
Nov 7, 2025
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