0 Items
My account
Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

IEC 62047-34:2019 ED1

Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer

Apr 5, 2019

General information

60.60     Apr 5, 2019

IEC

TC 47/SC 47F

International Standard

31.080.99     31.140  

English  

Buying

Published

Language in which you want to receive the document.

Scope

IEC 62047-34:2019 (E) describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.

Life cycle

NOW

PUBLISHED
IEC 62047-34:2019 ED1
60.60 Standard published
Apr 5, 2019