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Glavni meni

IEC 62047-34:2019 ED1

Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
5. 4. 2019.

Опште информације

60.60     5. 4. 2019.

IEC

TC 47/SC 47F

Međunarodni standard

31.080.99     31.140  

engleski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

IEC 62047-34:2019 (E) describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 62047-34:2019 ED1
60.60 Standard objavljen
5. 4. 2019.