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ISO 17470:2004

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Sep 13, 2004
95.99   Withdrawal of Standard   Jan 6, 2014

General information

95.99     Jan 6, 2014

ISO

ISO/TC 202/SC 2

International Standard

71.040.99  

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Scope

ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Life cycle

NOW

WITHDRAWN
ISO 17470:2004
95.99 Withdrawal of Standard
Jan 6, 2014

REVISED BY

PUBLISHED
ISO 17470:2014