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ISO 17470:2004

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
13. 9. 2004.
95.99   Povučen   6. 1. 2014.

Опште информације

95.99     6. 1. 2014.

ISO

ISO/TC 202/SC 2

Međunarodni standard

71.040.99  

engleski   francuski  

Kupovina

Povučen

Jezik na kome želite da primite dokument.

Apstrakt

ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Životni ciklus

TRENUTNO

POVUČEN
ISO 17470:2004
95.99 Povučen
6. 1. 2014.

REVIDIRAN OD

OBJAVLJEN
ISO 17470:2014