Objavljen
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
OBJAVLJEN
ISO 18452:2005
90.93
Odluka o potvrđivanju standarda
13. 3. 2025.
Fina keramika (savremena keramika, savremena tehnička keramika) – Određivanje debljine keramičke prevlake kontaktnim profilometrom
60.60 Standard objavljen