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ISO/DTS 23879

Nanotechnologies — Structural characterization of graphene oxide flakes — Thickness and lateral size measurement using atomic force microscopy and scanning electron microscopy

General information

50.20     Oct 27, 2026

ISO

ISO/TC 229

Technical Specification

07.120  

Scope

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

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PROJECT
ISO/DTS 23879
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Oct 27, 2026

National adoptions

dnaSRPS CEN ISO/TS 23879:2026  
ISS

Nanotechnologies - Structural characterization of graphene oxide flakes - Thickness and lateral size measurement using atomic force microscopy and scanning electron microscopy (ISO/DTS 23879:2026)

50.20   Proof sent to secretariat or FDIS ballot initiated: 8 weeks

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