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dnaSRPS CEN ISO/TS 23879:2026

Nanotechnologies - Structural characterization of graphene oxide flakes - Thickness and lateral size measurement using atomic force microscopy and scanning electron microscopy (ISO/DTS 23879:2026)

General information

50.20     Oct 29, 2026

50.60    Dec 22, 2026

ISS

Z229

Technical Specification

07.120  

English  

Scope

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

Life cycle

NOW

PROJECT
dnaSRPS CEN ISO/TS 23879:2026
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Oct 29, 2026

Related project

Adopted from FprCEN ISO/TS 23879 IDENTICAL

Adopted from ISO/DTS 23879 IDENTICAL

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