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prSRPS CEN ISO/TS 23879:2026

Nanotechnologies -- Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM

General information

10.99     Apr 23, 2026

ISS

Z229

Technical Specification

English  

Scope

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

Life cycle

NOW

PROJECT
prSRPS CEN ISO/TS 23879:2026
10.99 New project approved
Apr 23, 2026

Related project

Adopted from prCEN ISO/TS 23879 IDENTICAL

Adopted from ISO/DTS 23879 IDENTICAL