This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.
PROJECT
prSRPS CEN ISO/TS 23879:2026
10.99
New project approved
Apr 23, 2026