This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.
PROJECT
dnaSRPS CEN ISO/TS 23879:2026
50.20
Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Oct 29, 2026
To view the full content, you need to register or to log in to your account by clicking on the "Log in" button