Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs Certification body: sertifikaciono.telo@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

ISO/AWI 23420

Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis

General information

10.99     Sep 24, 2026

ISO

ISO/TC 202/SC 3

International Standard

Scope

This document specifies a determination procedure of energy resolution in the scanning transmission electron microscope or the transmission electron microscope equipped with the electron energy loss (EEL) spectrometer.
This document is applicable to both in-column type EEL spectrometer and post-column type EEL spectrometer. These EEL signal detecting systems are applicable to a parallel detecting system and a serial detecting system.

Life cycle

PREVIOUSLY

PUBLISHED
ISO 23420:2021

NOW

PROJECT
ISO/AWI 23420
10.99 New project approved
Sep 24, 2026