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naSRPS EN IEC 60444-11:2023

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction

General information

40.60     May 23, 2025

ISS

N040

European Norm

31.140  

English  

Scope

IEC 60444-11:2026 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.

This edition includes the following significant technical changes with respect to the previous edition:

a) key content of withdrawn IEC TR 60444-4 is reproduced as Annex A;

b) some formulae in the first edition have been corrected.

Life cycle

PREVIOUSLY

PUBLISHED
SRPS EN 60444-11:2011

NOW

PROJECT
naSRPS EN IEC 60444-11:2023
40.60 Close of voting
May 23, 2025

Related project

Adopted from prEN IEC 60444-11:2025 IDENTICAL

Adopted from IEC 60444-11:2026 ED2 IDENTICAL