Published
IEC 60444-11:2010 defines the standard method of measuring load resonance frequency f<sub>L</sub> at the nominal value of C<sub>L</sub>, and the determination of the effective load capacitance C<sub>Leff</sub> at the nominal frequency for crystals with the figure of merit M > 4.
PUBLISHED
SRPS EN 60444-11:2011
60.60
Standard published
Mar 31, 2011
PROJECT
naSRPS EN IEC 60444-11:2023