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prSRPS EN IEC 63378-6-2:2026

Thermal standardization on semiconductor packages - Part 6-2: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points - Model creation method using a measurement data of semiconductor device

General information

10.99     Aug 31, 2026

ISS

N022

European Norm

31.080.01  

English  

Life cycle

NOW

PROJECT
prSRPS EN IEC 63378-6-2:2026
10.99 New project approved
Aug 31, 2026

Related project

Adopted from prEN IEC 63378-6-2 IDENTICAL

Adopted from IEC 63378-6-2 ED1 IDENTICAL