Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

SRPS EN 62374:2008

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

Jun 19, 2008

General information

60.60     Jun 19, 2008

ISS

N022

European Norm

31.080  

English  

Buying

Published

Language in which you want to receive the document.

Scope

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

Life cycle

NOW

PUBLISHED
SRPS EN 62374:2008
60.60 Standard published
Jun 19, 2008

Related project

Adopted from EN 62374:2007