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SRPS EN 60749-2:2008

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

Dec 29, 2008

General information

60.60     Dec 29, 2008

ISS

N022

European Norm

31.080.01  

English  

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Scope

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.

Life cycle

NOW

PUBLISHED
SRPS EN 60749-2:2008
60.60 Standard published
Dec 29, 2008

Related project

Adopted from EN 60749-2:2002