Projekti

Visual comfort of display terminals - Part 1: Introduction

40.99   Nacrt standarda prihvata se kao definitivni tekst nacrta standarda

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle

40.60   Završetak javne rasprave

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process

40.00   Dopunjavanje i evidentiranje podataka o nacrtu standarda

Quantum Interconnect – Part 1: Introduction and roadmap for standardization

50.00   Evidentiranje podataka o definitivnom tekstu nacrta standarda

High-level test description table for development of production test programs

40.99   Nacrt standarda prihvata se kao definitivni tekst nacrta standarda

Guideline of High-Level Test Description Table for Development of Production Test Programs

50.00   Evidentiranje podataka o definitivnom tekstu nacrta standarda

Rotating electrical machines for the traction of road vehicles

30.20   Početak izjašnjavanja o nacrtu komisije standarda

Nuclear power plants - Instrumentation, control and electrical power systems - System software vulnerability and system software end-of-support management

50.00   Evidentiranje podataka o definitivnom tekstu nacrta standarda

Design principles and validation methods for the maintenance of microbial control for non-disposable fluid paths of dialysis equipment

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Prosumer plugs and prosumer inlets for household and similar purposes - Part 2: Standard sheets and gauges

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Atmospheric and altitude correction

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Measuring equipment for electrical and electromagnetic quantities - Environmental aspects

50.00   Evidentiranje podataka o definitivnom tekstu nacrta standarda

Semiconductor devices - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 1: Classification of defects

40.60   Završetak javne rasprave

LOW-VOLTAGE FUSES: Product data and properties for information exchange

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Open Charge Point Protocol 2.01 Ed4 (Fast track)

40.20   Nacrt na javnoj raspravi 60 dana

Open Charge Point Protocol 2.1 Ed2 (fast track)

40.20   Nacrt na javnoj raspravi 60 dana

Interpretation of Dissolved Gas Analysis (DGA) in natural and synthetic esters

50.00   Evidentiranje podataka o definitivnom tekstu nacrta standarda