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dnaSRPS EN IEC 63287-3:2024

Poluprovodničke komponente – Opšte smernice za kvalifikaciju poluprovodnika – Deo 3: Smernice za planove kvalifikacije pouzdanosti energetskih poluprovodničkih modula

Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module

Опште информације

50.20     24. 4. 2026.

50.60    5. 6. 2026.

ISS

N022

Evropski standard

31.080.01  

engleski  

Apstrakt

IEC 63287-3 ED1 specifies guidelines for a reliability qualification plan for power semiconductor modules to assure reliability targets over the entire product life.
Power semiconductor modules with incorporated control circuits are excluded. Clamped packages that need external pressure for being mounted in a system are excluded, e.g. disc-type pressure pack devices.
This document is not intended for medical, military, aeronautics and astronautics-related applications.
NOTE: Throughout the document, the term power semiconductor module refers to multichip semiconductor power modules defined as "isolated or non-isolated semiconductor module with two or more semiconductor chips, according to the package outline style code “MP” specified in IEC 60191‑4".

Životni ciklus

TRENUTNO

PROJEKAT
dnaSRPS EN IEC 63287-3:2024
50.20 Početak postupka odobravanja definitivnog teksta nacrta standarda
24. 4. 2026.

Povezani projekti

Identičan sa FprEN IEC 63287-3:2026 IDENTICAL

Identičan sa IEC 63287-3 ED1 IDENTICAL

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