naSRPS EN IEC 63740:2026
Guideline for gate oxide reliability and robustness evaluation procedures for silicon carbide power mosfets (Fast Track)
General information
40.20
Jul 17, 2026
40.60
Sep 18, 2026
ISS
N022
European Norm
English
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Life cycle
NOW
PROJECT
naSRPS EN IEC 63740:2026
40.20
DIS ballot initiated: 12 weeks
Jul 17, 2026
Related project
Adopted from
prEN IEC 63470:2026
IDENTICAL
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