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IEC 61967-6:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
24. 6. 2008.

Опште информације

60.60     25. 6. 2002.

IEC

TC 47/SC 47A

Međunarodni standard

31.200  

engleski   francuski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 61967-6:2002 ED1
60.60 Standard objavljen
25. 6. 2002.

ISPRAVKE / IZMENE

OBJAVLJEN
IEC 61967-6:2002/AMD1:2008 ED1

OBJAVLJEN
IEC 61967-6:2002/COR1:2010 ED1