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IEC 62047-40:2021 ED1

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
3. 9. 2021.

Опште информације

60.60     3. 9. 2021.

IEC

TC 47/SC 47F

Međunarodni standard

31.080.99  

engleski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 62047-40:2021 ED1
60.60 Standard objavljen
3. 9. 2021.