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Glavni meni

IEC TR 62433-4-1:2025 ED1

EMC IC modelling - Part 4-1: Use of ICIM-CI model to predict the IC conducted immunity in a PCB
26. 8. 2025.

Опште информације

60.60     26. 8. 2025.

IEC

TC 47/SC 47A

Tehnički izveštaj

31.200  

engleski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

IEC TR 62433-4-1:2025 provides an overview of good practices to extract an ICIM-CI model from measurements and to build a numerical model of the PCB in which the ICIM-CI model is used to predict RF immunity of an IC in its application PCB.
This document also discusses factors which can be considered to obtain proper results in an ICIM-CI model extraction and use of the actual model at the PCB level.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC TR 62433-4-1:2025 ED1
60.60 Standard objavljen
26. 8. 2025.