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IEC TS 63342:2022 ED1

C-Si photovoltaic (PV) modules - Light and elevated temperature induced degradation (LETID) test - Detection
20. 7. 2022.

Опште информације

60.60     20. 7. 2022.

IEC

TC 82

Tehnička specifikacija

27.160  

engleski  

Kupovina

Objavljen

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Apstrakt

IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.

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TRENUTNO

OBJAVLJEN
IEC TS 63342:2022 ED1
60.60 Standard objavljen
20. 7. 2022.